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Stress concentration due to an array or hemispherical cavities at the surface of an elastic half-space

机译:由于弹性半空间表面上的阵列或半球形空腔引起的应力集中

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摘要

The paper investigates the perturbation in an otherwise uniform stress field in an elastic half-space due to a doubly-periodic array of small hemispherical holes at the free surface. The solution is obtained using three potential functions of double Fourier series form in Galerkin's strain potential solution, the coefficients of which are determined using the collocation method. The unperturbed field is taken to be one of uniform plane stress parallel to the free surface. Two special cases are studied—uniform tension and uniform shear stress. Numerical results for these cases can be generalized by superposition to give solutions for a general state of biaxial plane stress. It is found that, for both tension and shear, the maximum stress concentration occurs at the bottom of the holes. The stress concentration factor increases with the ratio of hole spacing to radius, approaching the known solution for a single hemispherical hole at large ratios.
机译:本文研究了弹性半空间中原本均匀应力场中的扰动,这是由于自由表面上的小半球形孔的双周期阵列引起的。在Galerkin应变势解中使用双重傅里叶级数形式的三个势函数获得解,并使用搭配方法确定其系数。不受干扰的场被视为平行于自由表面的均匀平面应力之一。研究了两种特殊情况-均匀张力和均匀剪切应力。这些情况的数值结果可以通过叠加来概括,以给出双轴平面应力的一般状态的解。发现对于拉力和剪切力,最大应力集中发生在孔的底部。应力集中系数随孔间距与半径之比的增加而增加,以大比例接近单个半球形孔的已知解决方案。

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